Scanning Electron Microscopes
Hitachi S 4300
High resolution FEG SEM. The field emission gun allows the user to produce a small probe with high current density for better resolution and enhanced microanalysis. The microscope is equipped with an Energy Dispersive X-Ray Spectrometer for elemental microanalysis. Resolution of this microscope is 5nm at 1kV and 1.5nm at 15kV. This microscope is on loan from Hitachi Instruments. Use of the microscope may be arranged through Dr. Joy.