Instruments
Optical Microscopy
Transmission Electron Microscopy
Scanning Electron Microscopy and Focused Ion Beam
Atomic Force Microscopy
Sample Preparation Equipment
- Dimpling grinder
- Fischione plasma cleaner
- Gatan Cryoplunge Cp3
- Gatan precision ion polisher
- Ladd critical point dryer
- Leica EMFC7 ultramicrotome
- Leica (Reichert) OMU3 ultramicrotome
- Multi-prep polishing system
- Slow speed diamond saw
- SPI sputter coater